JEOL 6700F Scanning Electron Microscope

Microscope features:

  • Cold Cathode Field Emission Gun
  • 1.0 nm resolution at 15 KV
  • 2.2 nm resolution at 1 KV
  • Backscatter ELectron Detector (compositional and topographical imaging)
  • EDX Detector

Contact: Peter Searson

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